Atomic force microscopy

(Reguidit frae Atomic force microscope)

Atomic force microscopy (AFM) or scannin force microscopy (SFM) is a very heich-resolution type o scannin probe microscopy, wi demonstrated resolution on the order o fractions o a nanometer, mair nor 1000 times better nor the optical diffraction leemit.

An atomic force microscope on the left wi controllin computer on the richt.